Ion beam analysis
From Wikipedia, the free encyclopedia
Ion beam analysis is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition, obtain elemental depth profiles, or determine the depth profile of damage in single crystals. The last conference (Seville, Spain, 2005) was published in Nuclear Instruments and Methods.
- RBS: Rutherford backscattering is sensitive to heavy elements in a light matrix
- ERD: Elastic recoil analysis is sensitive to light elements in a heavy matrix
- PIXE: Particle induced X-ray emission gives the trace and minor elemental composition
- NRA: Nuclear reaction analysis is sentitive to particular isotopes
Channelling:
[edit] External links
 |
This Analytical chemistry-related article is a stub. You can help Wikipedia by expanding it. |
